Rotable Parts Exchange serves as a comprehensive source for military products, aerospace equipment, and Test Set Semiconduc items. You have expressed particular interest in part number TS268EU, a Voron Electronics Corp component we offer that is presented with the NSN 6625-00-923-6534 for straightforward identification and procurement. By completing and submitting the Request for Quote form provided on this page, you can obtain pricing details on this NSN part for your comparisons. Once our staff members receive and review your submitted information, a dedicated account manager will directly contact you with a response within 15 minutes or less.
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We strive to streamline the purchasing process and simplify it as much as possible, which includes providing detailed listings for all components to help customers pinpoint their exact needs. For instance, part number TS268EU is manufactured by Voron Electronics Corp under the CAGE Code 94518. Additionally, by using the initial digits of the NSN 6625-00-923-6534, you can discover that this component is associated with the FSC 6625 Electrical and Electronic Properties Measuring and Testing Instruments. If you have any specific questions about our database, you may always give us a call or email, as we would be delighted to assist you however we can. Otherwise, we encourage you to secure a quote for part number TS268EU at your earliest convenience.
| MRC | Criteria | Characteristic |
|---|---|---|
| ABRY | Length | 8.187 INCHES NOMINAL |
| MRC | Decoded Requirement | Clear Text Reply |
| HGTH | Height | 3.625 INCHES NOMINAL |
| AQXZ | Operating Test Capability | FRONT RESISTANCE-NOT GREATER THAN 0.5 KILOHM FOR A GOOD CRYSTAL; BACK RESISTANCE-RATIO OF BACK TO FRONT RESISTANCE GREATER THAN 10 TO 1 FOR A GOOD CRYSTAL; BACK CURRENT-CRYSTAL SHOULD NOT INDICATE CURRENT GREATER THAN - CRYSTAL IN21 AND IN23,IN23A,IN25,IN21A AND IN23B,IN21B,IN26 WE,IN26 SYL,IN78 SYL - CURRENT D. C. 0.400 MA,0.300 MA,0.250 MA,0.175 MA,0.125 MA,0.110 MA,0.230 MA,0.160 MA |
| ABGL | Width | 6.000 INCHES NOMINAL |
| AQXY | Test Type For Which Designed | FRONT RESISTANCE OF CRYSTAL; BACK RESISTANCE OF CRYSTAL; BACK CURRENT OF CRYSTAL |
| ALSF | Internal Battery Accommodation | INCLUDED |
| ANPZ | Inclosure Feature | SINGLE ITEM W/CARRYING CASE |
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